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TU-Clausthal Institute of Physical Chemistry

Scanning force microscopy

AFM

Since 2022, the Institute of Physical Chemistry has a “Park Systems NX12” scanning force microscope. It can be used for a wide range of imaging (mostly topography), investigations and measurements on surfaces. It offers all standard measurement modes (contact mode, intermittent/tapping mode and non-contact mode). The Kelvin probe and piezo force modes are also available. Semi-quantitative nanomechanical characterizations are also possible.
Separate actuators for (lateral) x,y and (vertical) z movements allow for measuring samples with strong height structuring at high scanning speeds.
In addition to IPC research projects, the device is also available for service measurements (contact: arne.langhoff@tu-clausthal.de).


Sample size: (typically) up to 5 cm x 5 cm x 1 cm (larger samples by arrangement)
Max. path of the z-scanner: 15 µm
Image size: up to 90 µm x 90 µm with max. 4096 x 4096 pixel resolution
Scanning speed (typically) up to 60 µm/s

Goldene Schichten nebeneinander gestapelt
Growth of an insulin crystal (series of images taken by I. Reviakine)
image: ParkSystem NX12 AFM
ParkSystems NX12 atomic force microscope in acoustic enclosure
image: scan head of ParkSystems NX12 with sample holder
scan head with sample holder